Digital Image Correlation of Heterogeneous Deformation in Polycrystalline Material with Electron Backscatter Diffraction
نویسندگان
چکیده
منابع مشابه
Crystallographic preferred orientations analysis of quartz crystals in Psammite using electron backscatter diffraction,western Ireland
The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملStress Field Analysis of V-Notches with Tip Cracks in a Polymer Material Using Digital Image Correlation
In this study, displacement field around v-notches of a poly methyl metha crylate (PMMA) specimen with tip cracks will be analyzed using digital image correlation technique. First intensity factor in combination with in-plane rigid body translations and rotation components will be determined by linear least squares fitting of the displacement field data to the corresponding relations among stre...
متن کاملElectron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
متن کاملNanoscale Deformation Analysis With High-Resolution Transmission Electron Microscopy and Digital Image Correlation
We present an application of the digital image correlation (DIC) method to highresolution transmission electron microscopy (HRTEM) images for nanoscale deformation analysis. The combination of DIC and HRTEM offers both the ultrahigh spatial resolution and high displacement detection sensitivity that are not possible with other microscope-based DIC techniques. We demonstrate the accuracy and uti...
متن کاملDirect detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2015
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927615006625